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Variable-Temperature Scanning Tunneling Microscope (30K-300K)

Variable-Temperature Scanning Tunneling Microscope (30K-300K)

This system is located in the Science Faculty at the Universidad Autónoma de Madrid. Is installed in a Ultra high Vacuum (UHV) system containing the standard sample preparation facilities, including ion sputtering, sample annealing, material evaporators (atomic and molecular) and a quadrupolar mass spectrometer (QMS). Regarding sample characterization, it is possible to perform Low Energy Electron Diffraction (LEED) as well as Auger Electron Spectroscopy (AES). The system is equipped with a special STM tip preparation sub-chamber, allowing ion sputtering, annealing and material evaporation on the STM tips. The sample temperature can be varied from 30K up to 300K while the tip remains at 300K.
Low-Temperature Scanning Tunneling Microscope (4.8K-77K)

Low-Temperature Scanning Tunneling Microscope (4.8K-77K)

The system consists in a series of Ultra High Vacuum chambers (UHV) containing the standard sample preparation facilities, including ion sputtering, sample annealing, material evaporators (atomic and molecular) and a quadrupolar mass spectrometer (QMS). Regarding sample characterization, it is possible to perform Low Energy Electron Diffraction (LEED) as well as Auger Electron Spectroscopy (AES). As main measurement technique we have cryogenic STM attached to a standard 4K Helium bath cryostat. The system is also equipped with a special STM tip preparation sub-chamber, allowing ion sputtering, annealing and material evaporation on the STM tips. The tip and sample temperature can be varied from 4.8KK up to 77K.
Low Temperature Scanning Tunneling Microscope (1.1K-77K)

Low Temperature Scanning Tunneling Microscope (1.1K-77K)

The system consists in a series of Ultra High Vacuum chambers (UHV) containing the standard sample preparation facilities, including ion sputtering, sample annealing, material evaporators (atomic and molecular) and a quadrupolar mass spectrometer (QMS). Regarding sample characterization, it is possible to perform Low Energy Electron Diffraction (LEED) as well as Auger Electron Spectroscopy (AES). As main measurement technique we have cryogenic STM attached to a 1K Joule-Thompson cryostat. The STM is located within a superconducting coil that can apply a magnetic field perpendicular to the sample surface up to 3T. The system is also equipped with a special STM tip preparation sub-chamber, allowing ion sputtering and material evaporation on the STM tips.
  • Variable-Temperature Scanning Tunneling Microscope (30K-300K)
  • Low-Temperature Scanning Tunneling Microscope (4.8K-77K)
  • Low Temperature Scanning Tunneling Microscope (1.1K-77K)
  • Variable-Temperature Scanning Tunneling Microscope (30K-300K)

    This system is located in the Science Faculty at the Universidad Autónoma de Madrid. Is installed in a Ultra high Vacuum (UHV) system containing the standard sample preparation facilities, including ion sputtering, sample annealing, material evaporators (atomic and molecular) and a quadrupolar mass spectrometer (QMS). Regarding sample characterization, it is possible to perform Low Energy Electron Diffraction (LEED) as well as Auger Electron Spectroscopy (AES). The system is equipped with a special STM tip preparation sub-chamber, allowing ion sputtering, annealing and material evaporation on the STM tips. The sample temperature can be varied from 30K up to 300K while the tip remains at 300K.
  • Low-Temperature Scanning Tunneling Microscope (4.8K-77K)

    The system consists in a series of Ultra High Vacuum chambers (UHV) containing the standard sample preparation facilities, including ion sputtering, sample annealing, material evaporators (atomic and molecular) and a quadrupolar mass spectrometer (QMS). Regarding sample characterization, it is possible to perform Low Energy Electron Diffraction (LEED) as well as Auger Electron Spectroscopy (AES). As main measurement technique we have cryogenic STM attached to a standard 4K Helium bath cryostat. The system is also equipped with a special STM tip preparation sub-chamber, allowing ion sputtering, annealing and material evaporation on the STM tips. The tip and sample temperature can be varied from 4.8KK up to 77K.
  • Low Temperature Scanning Tunneling Microscope (1.1K-77K)

    The system consists in a series of Ultra High Vacuum chambers (UHV) containing the standard sample preparation facilities, including ion sputtering, sample annealing, material evaporators (atomic and molecular) and a quadrupolar mass spectrometer (QMS). Regarding sample characterization, it is possible to perform Low Energy Electron Diffraction (LEED) as well as Auger Electron Spectroscopy (AES). As main measurement technique we have cryogenic STM attached to a 1K Joule-Thompson cryostat. The STM is located within a superconducting coil that can apply a magnetic field perpendicular to the sample surface up to 3T. The system is also equipped with a special STM tip preparation sub-chamber, allowing ion sputtering and material evaporation on the STM tips.
  • Variable-Temperature Scanning Tunneling Microscope (30K-300K)
  • Low-Temperature Scanning Tunneling Microscope (4.8K-77K)
  • Low Temperature Scanning Tunneling Microscope (1.1K-77K)